ISO 24173:2009 gives advice on how to generate reliable and reproducible crystallographic orientation measurements using electron backscatter diffraction (EBSD). It addresses the requirements for specimen preparation, instrument configuration, instrument calibration and data acquisition.
Document published on: 2009-09-01 Edition: 1 (Monolingual) ICS: 71.040.50 Status: Published Stage: 90.60 (2014-12-17) TC/SC: ISO/TC 202 Number of Pages: 43
No revision information available
No corrigenda or amendments available