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ISO 24173:2009
Microbeam analysis -- Guidelines for orientation measurement using electron backscatter diffraction
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Abstract
ISO 24173:2009 gives advice on how to generate reliable and reproducible crystallographic orientation measurements using electron backscatter diffraction (EBSD). It addresses the requirements for specimen preparation, instrument configuration, instrument calibration and data acquisition.
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Edition: 1 (Monolingual) ICS: 71.040.50 Status: Published Stage: 60.60 (2009-09-14) TC/SC: ISO/TC 202 Number of Pages: 43 -
No revision information available
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No corrigenda or amendments available
