Microbeam analysis -- Guidelines for orientation measurement using electron backscatter diffraction
This standard was last reviewed* in 2015.
ISO 24173:2009 gives advice on how to generate reliable and reproducible crystallographic orientation measurements using electron backscatter diffraction (EBSD). It addresses the requirements for specimen preparation, instrument configuration, instrument calibration and data acquisition.
Document published on: 2009-09-01 Edition: 1 (Monolingual) ICS: 71.040.50 Status: Published Stage: 90.93 (2015-10-30) TC/SC: ISO/TC 202 Number of Pages: 43
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No corrigenda or amendments available