This standard has been revised by: ISO 14997:2011
ISO 14997:2003 establishes the physical principles and practical means for the implementation of two methods, specified in ISO 10110-7, for measuring surface imperfections. These methods are: Method l, the surface area obscured or affected by the defects, and, Method ll, the visibility of the imperfections.
Both methods are suitable for prototype, small scale or large scale production of a wide variety of optical components. Imperfection appearance or functional tolerances related to a particular component can be determined by agreement between supplier and customer.
Document published on: 2003-04-15 Edition: 1 (Monolingual) ICS: 37.020 Status: Withdrawn Stage: 95.99 (2011-04-12) TC/SC: ISO/TC 172/SC 1 Number of Pages:
Revised by: ISO 14997:2011
No corrigenda or amendments available