This standard was last reviewed* in 2015.
Silicon content can be determined in the range of 0,2 % (m/m) to 1 % (m/m). The principle is dissolution of a test portion in acid, aspiration of the test solution into a nitrous oxide-acetylene flame of an atomic absorption spectrometer, measurement of the absorbance of the resonance line energy from the spectrum of silicon and comparison with that of calibration solutions at 251,6 nm.
Document published on: 1992-09-03 Edition: 1 (Monolingual) ICS: 77.120.40 Status: Published Stage: 90.93 (2015-03-18) TC/SC: ISO/TC 155 Number of Pages: 3
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