This standard has been revised by: ISO 6342:2003
The method specified determines the buildup thickness of the aperture card as the difference between the thickness of the buildup area and the thickness of the card both measured using a micrometer.
Document published on: 1993-08-05 Edition: 1 (Monolingual) ICS: 37.080 Status: Withdrawn Stage: 95.99 (2003-07-15) TC/SC: ISO/TC 171/SC 2 Number of Pages:
Revised by: ISO 6342:2003
No corrigenda or amendments available