This standard was last reviewed* in 2012.
Specifies measuring methods so that the film/process system can be obtained reproducibly and can also be compared with those of other systems. Describes sensitometric procedures for films exposed directly to X-rays. This second edition cancels and replaces the first edition (1981).
Document published on: 1991-08-08 Edition: 2 (Monolingual) ICS: 37.040.25 Status: Published Stage: 90.20 (2016-01-15) TC/SC: ISO/TC 42 Number of Pages: 10
Revises: ISO 5799:1981
No corrigenda or amendments available