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71.040.50: Physicochemical methods of analysis

Including spectrophotometric and chromatographic analysis

Items to be displayed:

Standard and/or projectStage TC
ISO 1392:1977
Determination of crystallizing point -- General method
90.93 ISO/TC 47/SC 1
ISO 2211:1973
Liquid chemical products -- Measurement of colour in Hazen units (platinum-cobalt scale)
90.93 ISO/TC 47/SC 1
ISO 11938:2012
Microbeam analysis -- Electron probe microanalysis -- Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
60.60 ISO/TC 202/SC 2
ISO 13067:2011
Microbeam analysis -- Electron backscatter diffraction -- Measurement of average grain size
90.20 ISO/TC 202
ISO 14594:2014
Microbeam analysis -- Electron probe microanalysis -- Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
60.60 ISO/TC 202/SC 2
ISO 16592:2012
Microbeam analysis -- Electron probe microanalysis -- Guidelines for determining the carbon content of steels using a calibration curve method
60.60 ISO/TC 202/SC 2
ISO/FDIS 19214
Microbeam analysis -- Analytical electron microscopy -- Guidelines for apparent growth direction determination of wirelike crystals by transmission electron microscopy
50.00 ISO/TC 202/SC 3
ISO/DIS 19463
Microbeam analysis -- Electron probe microanalyser (EPMA) -- Guidelines for performing quality assurance procedures
40.20 ISO/TC 202/SC 2
ISO/DIS 20263
Microbeam analysis -- Analytical transmission electron microscopy -- Determination method for interface position in the cross-sectional image of the layered materials
40.20 ISO/TC 202/SC 3
ISO 24173:2009
Microbeam analysis -- Guidelines for orientation measurement using electron backscatter diffraction
90.93 ISO/TC 202
ISO 25498:2010
Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
90.92 ISO/TC 202/SC 3
ISO/DIS 25498
Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
40.00 ISO/TC 202/SC 3