Items to be displayed:
| Standard and/or project | Stage | TC |
|---|---|---|
| ISO/DIS 3534-4 Statistics -- Vocabulary and symbols -- Part 4: Survey sampling | 40.60 | ISO/TC 69/SC 1 |
| ISO/DIS 3951-1 Sampling procedures for inspection by variables -- Part 1: Specification for single sampling plans indexed by acceptance quality limit (AQL) for lot-by-lot inspection for a single quality characteristic and a single AQL | 50.00 | ISO/TC 69/SC 5 |
| ISO/DIS 3951-2 Sampling procedures for inspection by variables -- Part 2: General specification for single sampling plans indexed by acceptance quality limit (AQL) for lot-by-lot inspection of independent quality characteristics | 50.00 | ISO/TC 69/SC 5 |
| ISO/DIS 7870-1 Control charts -- Part 1: General guidelines | 40.20 | ISO/TC 69/SC 4 |
| ISO/DIS 7870-5 Control charts -- Part 5: Specialized control charts | 40.99 | ISO/TC 69/SC 4 |
| ISO/NP TR 13195 Selected illustrations of response surface method | 10.99 | ISO/TC 69/SC 7 |
| ISO/DIS 13528 Statistical methods for use in proficiency testing by interlaboratory comparisons | 40.60 | ISO/TC 69/SC 6 |
| ISO/WD 15725-1 Accuracy (trueness and precision) of measurement methods and results -- Part 1: Introduction and basic principles | 20.20 | ISO/TC 69/SC 6 |
| ISO/WD 15725-2 Accuracy (trueness and precision) of measurement methods and results -- Part 2: Basic method to evaluate the accuracy of measurement methods | 20.20 | ISO/TC 69/SC 6 |
| ISO/DIS 16269-6 Statistical interpretation of data -- Part 6: Determination of statistical tolerance intervals | 40.99 | ISO/TC 69 |
| ISO/DIS 16336 Robust parameter design (RPD) | 40.20 | ISO/TC 69/SC 8 |
| ISO/AWI 16355-1 Application of statistical and related methods to New technology and Product Development Process -- Part 1: General Principle and Perspective of QFD Process | 20.00 | ISO/TC 69/SC 8 |
| ISO/AWI 16355-2 Application of statistical and related methods to New technology and Product Development Process -- Part 2: Acquisition of Non-quantitative VOC or VOS | 20.00 | ISO/TC 69/SC 8 |
| ISO/AWI 16355-3 Application of statistical and related methods to New technology and Product Development Process -- Part 3: Acquisition of Quantitative VOC or VOS | 20.00 | ISO/TC 69/SC 8 |
| ISO/AWI 16355-4 Application of statistical and related methods to New technology and Product Development Process -- Part 4: Analysis of Non-Quantitative and Quantitative VOC/VOS | 20.00 | ISO/TC 69/SC 8 |
| ISO/AWI 16355-5 Application of statistical and related methods to New technology and Product Development Process -- Part 5: Solution Strategy | 20.00 | ISO/TC 69/SC 8 |
| ISO/AWI 16355-6 Application of statistical and related methods to New technology and Product Development Process -- Part 6: Optimization - Robust parameter design | 20.00 | ISO/TC 69/SC 8 |
| ISO/AWI 16355-7 Application of statistical and related methods to New technology and Product Development Process -- Part 7: Optimization - Tolerance design and output to manufacturing | 20.00 | ISO/TC 69/SC 8 |
| ISO/AWI 16355-8 Application of statistical and related methods to New technology and Product Development Process -- Part 8: Guidelines for Commercialization | 20.00 | ISO/TC 69/SC 8 |
| ISO/NP TR 16705 Selected illustrations of contingency table analysis | 10.99 | ISO/TC 69/SC 7 |
| ISO/CD 17258 Benchmark for Six Sigma method | 30.60 | ISO/TC 69/SC 7 |
| ISO/WD 18404 Competencies for key personnel in relation to Six Sigma and Lean implementation | 20.20 | ISO/TC 69/SC 7 |
| ISO/FDIS 22514-2 Statistical methods in process management -- Capability and performance -- Part 2: Process capability and performance of time-dependent process models | 50.20 | ISO/TC 69/SC 4 |
| ISO/CD 22514-8 Statistical methods in process management -- Capability and performance -- Part 8: Machine performance of a multi-state production process | 30.99 | ISO/TC 69/SC 4 |
