Items to be displayed:
| Standard and/or project | Stage | ICS | TC |
|---|---|---|---|
| ISO 11938:2012 Microbeam analysis -- Electron probe microanalysis -- Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy | 60.60 | 71.040.50 | ISO/TC 202/SC 2 |
| ISO 13067:2011 Microbeam analysis -- Electron backscatter diffraction -- Measurement of average grain size | 60.60 | 71.040.50 | ISO/TC 202 |
| ISO 14594:2003 Microbeam analysis -- Electron probe microanalysis -- Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy | 90.93 | 71.040.50 | ISO/TC 202/SC 2 |
| ISO 14594:2003/Cor 1:2009 | 60.60 | 71.040.50 | ISO/TC 202/SC 2 |
| ISO 14595:2003 Microbeam analysis -- Electron probe microanalysis -- Guidelines for the specification of certified reference materials (CRMs) | 90.93 | 71.040.99 71.040.30 | ISO/TC 202/SC 2 |
| ISO 14595:2003/Cor 1:2005 | 60.60 | 71.040.99 71.040.30 | ISO/TC 202/SC 2 |
| ISO 15632:2012 Microbeam analysis -- Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis | 60.60 | 71.040.99 | ISO/TC 202 |
| ISO 16592:2012 Microbeam analysis -- Electron probe microanalysis -- Guidelines for determining the carbon content of steels using a calibration curve method | 60.60 | 71.040.50 | ISO/TC 202/SC 2 |
| ISO 16700:2004 Microbeam analysis -- Scanning electron microscopy -- Guidelines for calibrating image magnification | 90.60 | 37.020 | ISO/TC 202/SC 4 |
| ISO 17470:2004 Microbeam analysis -- Electron probe microanalysis -- Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry | 90.93 | 71.040.99 | ISO/TC 202/SC 2 |
| ISO 22029:2012 Microbeam analysis -- EMSA/MAS standard file format for spectral-data exchange | 60.60 | 71.040.99 | ISO/TC 202 |
| ISO 22309:2011 Microbeam analysis -- Quantitative analysis using energy-dispersive spectrometry (EDS) for elements with an atomic number of 11 (Na) or above | 60.60 | 71.040.99 | ISO/TC 202 |
| ISO 22489:2006 Microbeam analysis -- Electron probe microanalysis -- Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy | 90.93 | 71.040.99 | ISO/TC 202/SC 2 |
| ISO 22493:2008 Microbeam analysis -- Scanning electron microscopy -- Vocabulary | 90.60 | 01.040.37 37.020 | ISO/TC 202/SC 1 |
| ISO 23833:2013 Microbeam analysis -- Electron probe microanalysis (EPMA) -- Vocabulary | 60.60 | 01.040.71 71.040.99 | ISO/TC 202/SC 1 |
| ISO 24173:2009 Microbeam analysis -- Guidelines for orientation measurement using electron backscatter diffraction | 60.60 | 71.040.50 | ISO/TC 202 |
| ISO/TS 24597:2011 Microbeam analysis -- Scanning electron microscopy -- Methods of evaluating image sharpness | 60.60 | 37.020 | ISO/TC 202/SC 4 |
| ISO 25498:2010 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope | 60.60 | 71.040.50 | ISO/TC 202/SC 3 |
| ISO 29301:2010 Microbeam analysis -- Analytical transmission electron microscopy -- Methods for calibrating image magnification by using reference materials having periodic structures | 60.60 | 37.020 | ISO/TC 202/SC 3 |
