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ISO/TC 202  - Microbeam analysis

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Standards and projects under the direct responsibility of ISO/TC 202 Secretariat and its SCs

Standard and/or projectStageICSTC
ISO 11938:2012
Microbeam analysis -- Electron probe microanalysis -- Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
60.60 71.040.50ISO/TC 202/SC 2
ISO 13067:2011
Microbeam analysis -- Electron backscatter diffraction -- Measurement of average grain size
60.60 71.040.50ISO/TC 202
ISO 14594:2003
Microbeam analysis -- Electron probe microanalysis -- Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
90.92 71.040.50ISO/TC 202/SC 2
ISO 14594:2003/Cor 1:2009
60.60 71.040.50ISO/TC 202/SC 2
ISO 14595:2003
Microbeam analysis -- Electron probe microanalysis -- Guidelines for the specification of certified reference materials (CRMs)
90.92 71.040.99
71.040.30
ISO/TC 202/SC 2
ISO 14595:2003/Cor 1:2005
60.60 71.040.99
71.040.30
ISO/TC 202/SC 2
ISO 15632:2012
Microbeam analysis -- Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
60.60 71.040.99ISO/TC 202
ISO 15932:2013
Microbeam analysis -- Analytical electron microscopy -- Vocabulary
60.60 01.040.37
37.020
ISO/TC 202/SC 1
ISO 16592:2012
Microbeam analysis -- Electron probe microanalysis -- Guidelines for determining the carbon content of steels using a calibration curve method
60.60 71.040.50ISO/TC 202/SC 2
ISO 16700:2004
Microbeam analysis -- Scanning electron microscopy -- Guidelines for calibrating image magnification
90.92 37.020ISO/TC 202/SC 4
ISO 17470:2014
Microbeam analysis -- Electron probe microanalysis -- Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
60.60 71.040.99ISO/TC 202/SC 2
ISO 22029:2012
Microbeam analysis -- EMSA/MAS standard file format for spectral-data exchange
60.60 71.040.99ISO/TC 202
ISO 22309:2011
Microbeam analysis -- Quantitative analysis using energy-dispersive spectrometry (EDS) for elements with an atomic number of 11 (Na) or above
60.60 71.040.99ISO/TC 202
ISO 22489:2006
Microbeam analysis -- Electron probe microanalysis -- Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy
90.93 71.040.99ISO/TC 202/SC 2
ISO 22493:2014
Microbeam analysis -- Scanning electron microscopy -- Vocabulary
60.60 01.040.37
37.020
ISO/TC 202/SC 1
ISO 23833:2013
Microbeam analysis -- Electron probe microanalysis (EPMA) -- Vocabulary
60.60 01.040.71
71.040.99
ISO/TC 202/SC 1
ISO 24173:2009
Microbeam analysis -- Guidelines for orientation measurement using electron backscatter diffraction
90.20 71.040.50ISO/TC 202
ISO/TS 24597:2011
Microbeam analysis -- Scanning electron microscopy -- Methods of evaluating image sharpness
90.20 37.020ISO/TC 202/SC 4
ISO 25498:2010
Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
60.60 71.040.50ISO/TC 202/SC 3
ISO 29301:2010
Microbeam analysis -- Analytical transmission electron microscopy -- Methods for calibrating image magnification by using reference materials having periodic structures
60.60 37.020ISO/TC 202/SC 3