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ISO 21270:2004
Surface chemical analysis -- X-ray photoelectron and Auger electron spectrometers -- Linearity of intensity scale
This standard has been reviewed and then confirmed in 2010
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Abstract
ISO 21270:2004 specifies two methods for determining the maximum count rate for an acceptable limit of divergence from linearity of the intensity scale of Auger and X-ray photoelectron spectrometers. It also includes methods to correct for intensity non-linearities so that a higher maximum count rate can be employed for those spectrometers for which the relevant correction equations have been shown to be valid.
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Edition: 1 (Monolingual) ICS: 71.040.40 Status: Published Stage: 90.93 (2010-08-03) TC/SC: ISO/TC 201/SC 7 Number of Pages: 13 -
No revision information available
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No corrigenda or amendments available
