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ISO 6342:2003
Micrographics -- Aperture cards -- Method of measuring thickness of buildup area
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| Price | Language | ||
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| Paper | CHF 44,00 | Add to basket |
Abstract
ISO 6342:2003 specifies a method of measuring the thickness of the buildup area on aperture cards (camera and copy cards) for manufacturing and inspection purposes.
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Edition: 2 (Monolingual) ICS: 37.080 Status: Published Stage: 90.93 (2009-11-19) TC/SC: ISO/TC 171/SC 2 Number of Pages: 3 -
Revises: ISO 6342:1993
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No corrigenda or amendments available
