Including spectrophotometric and chromatographic analysis
Items to be displayed:
| Standard and/or project | Stage | TC |
|---|---|---|
| ISO 78-3:1983 Chemistry -- Layouts for standards -- Part 3: Standard for molecular absorption spectrometry | 90.93 | ISO/TC 47/SC 1 |
| ISO 78-4:1983 Layouts for standards -- Part 4: Standard for atomic absorption spectrometric analysis | 90.93 | ISO/TC 47/SC 1 |
| ISO 1392:1977 Determination of crystallizing point -- General method | 90.93 | ISO/TC 47/SC 1 |
| ISO 2211:1973 Liquid chemical products -- Measurement of colour in Hazen units (platinum-cobalt scale) | 90.93 | ISO/TC 47/SC 1 |
| ISO 6286:1982 Molecular absorption spectrometry -- Vocabulary -- General -- Apparatus | 90.93 | ISO/TC 47/SC 1 |
| ISO 6955:1982 Analytical spectroscopic methods -- Flame emission, atomic absorption, and atomic fluorescence -- Vocabulary | 90.93 | ISO/TC 47/SC 1 |
| ISO 11938:2012 Microbeam analysis -- Electron probe microanalysis -- Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy | 60.60 | ISO/TC 202/SC 2 |
| ISO 13067:2011 Microbeam analysis -- Electron backscatter diffraction -- Measurement of average grain size | 60.60 | ISO/TC 202 |
| ISO 14594:2003 Microbeam analysis -- Electron probe microanalysis -- Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy | 90.93 | ISO/TC 202/SC 2 |
| ISO 14594:2003/Cor 1:2009 | 60.60 | ISO/TC 202/SC 2 |
| ISO 16592:2012 Microbeam analysis -- Electron probe microanalysis -- Guidelines for determining the carbon content of steels using a calibration curve method | 60.60 | ISO/TC 202/SC 2 |
| ISO/WD 17802 Microbeam analysis -- Analytical transmission electron microscopy -- Methods of the energy calibration for electron energy loss spectroscopy | 20.20 | ISO/TC 202/SC 3 |
| ISO 24173:2009 Microbeam analysis -- Guidelines for orientation measurement using electron backscatter diffraction | 60.60 | ISO/TC 202 |
| ISO 25498:2010 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope | 60.60 | ISO/TC 202/SC 3 |
