Including microscopes, telescopes, binoculars, optical materials, optical components and optical systems
Ophthalmic equipment, see 11.040.70
Optical measuring instruments, see 17.180.30
Photographic equipment lenses, see 37.040.10
Items to be displayed:
| Standard and/or project | Stage | TC |
|---|---|---|
| ISO 8036:2006 Optics and photonics -- Microscopes -- Immersion liquids for light microscopy | 90.93 | ISO/TC 172/SC 5 |
| ISO 8036-1:1998 Optics and optical instruments -- Microscopes -- Part 1: Immersion oil for general use in light microscopy | 95.99 | ISO/TC 172/SC 5 |
| ISO 8036-1:1986 Optics and optical instruments -- Microscopes -- Part 1: Immersion oil for general use in light microscopy | 95.99 | ISO/TC 172/SC 5 |
| ISO 8037-1:1986 Optics and optical instruments -- Microscopes -- Slides -- Part 1: Dimensions, optical properties and marking | 90.93 | ISO/TC 172/SC 5 |
| ISO 8037-2:1997 Optics and optical instruments -- Microscopes -- Slides -- Part 2: Quality of material, standards of finish and mode of packaging | 90.92 | ISO/TC 172/SC 5 |
| ISO/DIS 8037-2 Microscopes -- Slides -- Part 2: Quality of material, standards of finish and mode of packaging | 40.99 | ISO/TC 172/SC 5 |
| ISO 8037-2:1997/Cor 1:2002 | 60.60 | ISO/TC 172/SC 5 |
| ISO/DIS 8038 Microscopes -- Screw threads for objectives and related nosepieces | 40.20 | ISO/TC 172/SC 5 |
| ISO 8038:2011 Microscopes -- Screw threads for objectives and related nosepieces | 90.92 | ISO/TC 172/SC 5 |
| ISO 8038:1985 Optics and optical instruments -- Microscopes -- Screw thread for objectives | 95.99 | ISO/TC 172/SC 5 |
| ISO 8038-1:1997 Optics and optical instruments -- Microscopes -- Screw threads for objectives and related nosepieces -- Part 1: Screw thread type RMS (4/5 in x 1/36 in) | 95.99 | ISO/TC 172/SC 5 |
| ISO 8038-2:2001 Optics and optical instruments -- Screw threads for microscope objectives and related nosepieces -- Part 2: Screw thread type M25 X 0,75 mm | 95.99 | ISO/TC 172/SC 5 |
| ISO 8039:2012 Microscopes -- Values, tolerances and symbols for magnification | 60.60 | ISO/TC 172/SC 5 |
| ISO 8039:1997 Optics and optical instruments -- Microscopes -- Magnification | 95.99 | ISO/TC 172/SC 5 |
| ISO 8040:2001 Optics and optical instruments -- Microscopes -- Dimensions of tube slide and tube slot connections | 90.93 | ISO/TC 172/SC 5 |
| ISO 8040:1986 Optics and optical instruments -- Microscopes -- Connecting dimensions of tube slides and tube slots | 95.99 | ISO/TC 172/SC 5 |
| ISO 8255-1:1986 Optics and optical instruments -- Microscopes -- Cover glasses -- Part 1: Dimensional tolerances, thickness and optical properties | 95.99 | ISO/TC 172/SC 5 |
| ISO 8255-1:2011 Microscopes -- Cover glasses -- Part 1: Dimensional tolerances, thickness and optical properties | 60.60 | ISO/TC 172/SC 5 |
| ISO/FDIS 8255-2 Microscopes -- Cover glasses -- Part 2: Quality of materials, standards of finish and mode of packaging | 50.00 | ISO/TC 172/SC 5 |
| ISO 8255-2:1997 Optics and optical instruments -- Microscopes -- Cover glasses -- Part 2: Quality of materials, standards of finish and mode of packaging | 90.92 | ISO/TC 172/SC 5 |
| ISO 8576:1996 Optics and optical instruments -- Microscopes -- Reference system of polarized light microscopy | 90.93 | ISO/TC 172/SC 5 |
| ISO 8577:1997 Optics and optical instruments -- Microscopes -- Spectral filters | 90.93 | ISO/TC 172/SC 5 |
| ISO 8578:2012 Microscopes -- Marking of objectives and eyepieces | 60.60 | ISO/TC 172/SC 5 |
| ISO 8578:1997 Microscopes -- Marking of objectives and eyepieces | 95.99 | ISO/TC 172/SC 5 |
| ISO 8578:1997/Cor 1:2002 | 95.99 | ISO/TC 172/SC 5 |
| ISO 8600-5:2005 Optics and photonics -- Medical endoscopes and endotherapy devices -- Part 5: Determination of optical resolution of rigid endoscopes with optics | 90.20 | ISO/TC 172/SC 5 |
| ISO 8600-6:2005 Optics and photonics -- Medical endoscopes and endotherapy devices -- Part 6: Vocabulary | 90.20 | ISO/TC 172/SC 5 |
| ISO 9022-1:2012 Optics and photonics -- Environmental test methods -- Part 1: Definitions, extent of testing | 60.60 | ISO/TC 172/SC 1 |
| ISO 9022-1:1994 Optics and optical instruments -- Environmental test methods -- Part 1: Definitions, extent of testing | 95.99 | ISO/TC 172/SC 1 |
| ISO 9022-2:2002 Optics and optical instruments -- Environmental test methods -- Part 2: Cold, heat and humidity | 90.92 | ISO/TC 172/SC 1 |
| ISO 9022-2:1994 Optics and optical instruments -- Environmental test methods -- Part 2: Cold, heat, humidity | 95.99 | ISO/TC 172/SC 1 |
| ISO 9022-3:1994 Optics and optical instruments -- Environmental test methods -- Part 3: Mechanical stress | 95.99 | ISO/TC 172/SC 1 |
| ISO 9022-3:1998 Optics and optical instruments -- Environmental test methods -- Part 3: Mechanical stress | 90.93 | ISO/TC 172/SC 1 |
| ISO 9022-4:1994 Optics and optical instruments -- Environmental test methods -- Part 4: Salt mist | 95.99 | ISO/TC 172/SC 1 |
| ISO 9022-4:2002 Optics and optical instruments -- Environmental test methods -- Part 4: Salt mist | 90.93 | ISO/TC 172/SC 1 |
| ISO 9022-5:1994 Optics and optical instruments -- Environmental test methods -- Part 5: Combined cold, low air pressure | 90.92 | ISO/TC 172/SC 1 |
| ISO 9022-6:1994 Optics and optical instruments -- Environmental test methods -- Part 6: Dust | 90.93 | ISO/TC 172/SC 1 |
| ISO 9022-7:2005 Optics and photonics -- Environmental test methods -- Part 7: Resistance to drip or rain | 90.93 | ISO/TC 172/SC 1 |
| ISO 9022-7:1994 Optics and optical instruments -- Environmental test methods -- Part 7: Drip, rain | 95.99 | ISO/TC 172/SC 1 |
| ISO 9022-7:1994/Cor 1:2001 | 95.99 | ISO/TC 172/SC 1 |
| ISO 9022-8:1994 Optics and optical instruments -- Environmental test methods -- Part 8: High pressure, low pressure, immersion | 90.93 | ISO/TC 172/SC 1 |
| ISO 9022-9:1994 Optics and optical instruments -- Environmental test methods -- Part 9: Solar radiation | 90.93 | ISO/TC 172/SC 1 |
| ISO 9022-10:1994 Optics and optical instruments -- Environmental test methods -- Part 10: Combined sinusoidal vibration, dry heat or cold | 95.99 | ISO/TC 172/SC 1 |
| ISO 9022-10:1998 Optics and optical instruments -- Environmental test methods -- Part 10: Combined sinusoidal vibration and dry heat or cold | 95.99 | ISO/TC 172/SC 1 |
| ISO 9022-11:1994 Optics and optical instruments -- Environmental test methods -- Part 11: Mould growth | 90.93 | ISO/TC 172/SC 1 |
| ISO 9022-12:1994 Optics and optical instruments -- Environmental test methods -- Part 12: Contamination | 90.93 | ISO/TC 172/SC 1 |
| ISO 9022-13:1998 Optics and optical instruments -- Environmental test methods -- Part 13: Combined shock, bump or free fall and dry heat or cold | 95.99 | ISO/TC 172/SC 1 |
| ISO 9022-13:1994 Optics and optical instruments -- Environmental test methods -- Part 13: Combined shock, bump or free fall, dry heat or cold | 95.99 | ISO/TC 172/SC 1 |
| ISO 9022-14:1994 Optics and optical instruments -- Environmental test methods -- Part 14: Dew, hoarfrost, ice | 90.93 | ISO/TC 172/SC 1 |
| ISO 9022-15:1998 Optics and optical instruments -- Environmental test methods -- Part 15: Combined digitally controlled broad-band random vibration and dry heat or cold | 95.99 | ISO/TC 172/SC 1 |
| ISO 9022-15:1994 Optics and optical instruments -- Environmental test methods -- Part 15: Combined random vibration wide band: reproducibility medium, in dry heat or cold | 95.99 | ISO/TC 172/SC 1 |
| ISO 9022-16:1998 Optics and optical instruments -- Environmental test methods -- Part 16: Combined bounce or steady-state acceleration and dry heat or cold | 95.99 | ISO/TC 172/SC 1 |
| ISO 9022-16:1994 Optics and optical instruments -- Environmental test methods -- Part 16: Combined bounce or steady-state acceleration, in dry heat or cold | 95.99 | ISO/TC 172/SC 1 |
| ISO 9022-17:1994 Optics and optical instruments -- Environmental test methods -- Part 17: Combined contamination, solar radiation | 90.93 | ISO/TC 172/SC 1 |
| ISO 9022-18:1994 Optics and optical instruments -- Environmental test methods -- Part 18: Combined damp heat and low internal pressure | 90.92 | ISO/TC 172/SC 1 |
| ISO 9022-19:1994 Optics and optical instruments -- Environmental test methods -- Part 19: Temperature cycles combined with sinusoidal or random vibration | 95.99 | ISO/TC 172/SC 1 |
| ISO 9022-20:1997 Optics and optical instruments -- Environmental test methods -- Part 20: Humid atmosphere containing sulfur dioxide or hydrogen sulfide | 90.93 | ISO/TC 172/SC 1 |
| ISO 9022-21:1998 Optics and optical instruments -- Environmental test methods -- Part 21: Combined low pressure and ambient temperature or dry heat | 90.92 | ISO/TC 172/SC 1 |
| ISO 9022-22:2012 Optics and photonics -- Environmental test methods -- Part 22: Combined cold, dry heat or temperature change with bump or random vibration | 60.60 | ISO/TC 172/SC 1 |
| ISO/DIS 9022-23 Optics and photonics -- Environmental test methods -- Part 23: Low pressure combined with cold, ambient temperature and dry and damp heat | 40.20 | ISO/TC 172/SC 1 |
| ISO 9039:1994 Optics and optical instruments -- Quality evaluation of optical systems -- Determination of distortion | 95.99 | ISO/TC 172/SC 1 |
| ISO 9039:2008 Optics and photonics -- Quality evaluation of optical systems -- Determination of distortion | 90.93 | ISO/TC 172/SC 1 |
| ISO 9039:1994/Cor 1:2004 | 95.99 | ISO/TC 172/SC 1 |
| ISO 9211-1:2010 Optics and photonics -- Optical coatings -- Part 1: Definitions | 60.60 | ISO/TC 172/SC 3 |
| ISO 9211-1:1994 Optics and optical instruments -- Optical coatings -- Part 1: Definitions | 95.99 | ISO/TC 172/SC 3 |
| ISO 9211-2:1994 Optics and optical instruments -- Optical coatings -- Part 2: Optical properties | 95.99 | ISO/TC 172/SC 3 |
| ISO 9211-2:2010 Optics and photonics -- Optical coatings -- Part 2: Optical properties | 60.60 | ISO/TC 172/SC 3 |
| ISO 9211-3:2008 Optics and photonics -- Optical coatings -- Part 3: Environmental durability | 90.93 | ISO/TC 172/SC 3 |
| ISO 9211-3:1994 Optics and optical instruments -- Optical coatings -- Part 3: Environmental durability | 95.99 | ISO/TC 172/SC 3 |
| ISO 9211-4:2012 Optics and photonics -- Optical coatings -- Part 4: Specific test methods | 60.60 | ISO/TC 172/SC 3 |
| ISO 9211-4:2006 Optics and optical instruments -- Optical coatings -- Part 4: Specific test methods | 95.99 | ISO/TC 172/SC 3 |
| ISO 9211-4:1996 Optics and optical instruments -- Optical coatings -- Part 4: Specific test methods | 95.99 | ISO/TC 172/SC 3 |
| ISO 9336-2:1994 Optics and optical instruments -- Optical transfer function -- Application -- Part 2: Lenses for office copiers | 95.99 | ISO/TC 172/SC 1 |
| ISO 9336-3:1994 Optics and optical instruments -- Optical transfer function -- Application -- Part 3: Telescopes | 90.93 | ISO/TC 172/SC 4 |
| ISO 9344:1996 Optics and optical instruments -- Microscopes -- Graticules for eyepieces | 95.99 | ISO/TC 172/SC 5 |
| ISO 9344:2011 Microscopes -- Graticules for eyepieces | 60.60 | ISO/TC 172/SC 5 |
| ISO 9345-1:1996 Optics and optical instruments -- Microscopes -- Imaging distances related to mechanical reference planes -- Part 1: Tube length 160 mm | 95.99 | ISO/TC 172/SC 5 |
| ISO 9345-1:2012 Microscopes -- Imaging distances related to mechanical reference planes -- Part 1: Tube length 160 mm | 60.60 | ISO/TC 172/SC 5 |
| ISO 9345-2:2003 Optics and optical instruments -- Microscopes: Imaging distances related to mechanical reference planes -- Part 2: Infinity-corrected optical systems | 90.20 | ISO/TC 172/SC 5 |
| ISO 9358:1994 Optics and optical instruments -- Veiling glare of image forming systems -- Definitions and methods of measurement | 90.93 | ISO/TC 172/SC 1 |
| ISO/DIS 10109 Optics and photonics -- Guidance for the selection of environmental tests | 40.20 | ISO/TC 172/SC 1 |
| ISO 10109-1:2005 Optics and photonics -- Environmental requirements -- Part 1: General overview, terms and definitions, climatic zones and their parameters | 90.92 | ISO/TC 172/SC 1 |
| ISO 10109-1:1994 Optics and optical instruments -- Environmental requirements -- Part 1: General information, definitions, climatic zones and their parameters | 95.99 | ISO/TC 172/SC 1 |
| ISO 10109-4:2001 Optics and optical instruments -- Environmental requirements -- Part 4: Test requirements for telescopic systems | 90.60 | ISO/TC 172/SC 4 |
| ISO 10109-6:1994 Optics and optical instruments -- Environmental requirements -- Part 6: Test requirements for medical optical devices | 95.99 | ISO/TC 172/SC 1 |
| ISO 10109-6:2005 Optics and photonics -- Environmental requirements -- Part 6: Test requirements for medical optical instruments | 90.92 | ISO/TC 172/SC 1 |
| ISO 10109-7:2001 Optics and optical instruments -- Environmental requirements -- Part 7: Test requirements for optical measuring instruments | 90.92 | ISO/TC 172/SC 1 |
| ISO 10109-8:1994 Optics and optical instruments -- Environmental requirements -- Part 8: Test requirements for extreme conditions of use | 95.99 | ISO/TC 172/SC 1 |
| ISO 10109-8:2005 Optics and photonics -- Environmental requirements -- Part 8: Test requirements for extreme conditions of use | 90.92 | ISO/TC 172/SC 1 |
| ISO 10109-11:2001 Optics and optical instruments -- Environmental requirements -- Part 11: Optical instruments for outdoor conditions of use | 90.92 | ISO/TC 172/SC 1 |
| ISO 10109-12:2004 Optics and optical instruments -- Environmental requirements -- Part 12: Conditions of transport for optical instruments | 90.92 | ISO/TC 172/SC 1 |
| ISO 10110-1:2006 Optics and photonics -- Preparation of drawings for optical elements and systems -- Part 1: General | 90.92 | ISO/TC 172/SC 1 |
| ISO 10110-1:1996 Optics and optical instruments -- Preparation of drawings for optical elements and systems -- Part 1: General | 95.99 | ISO/TC 172/SC 1 |
| ISO 10110-2:1996 Optics and optical instruments -- Preparation of drawings for optical elements and systems -- Part 2: Material imperfections -- Stress birefringence | 90.92 | ISO/TC 172/SC 1 |
| ISO 10110-3:1996 Optics and optical instruments -- Preparation of drawings for optical elements and systems -- Part 3: Material imperfections -- Bubbles and inclusions | 90.92 | ISO/TC 172/SC 1 |
| ISO 10110-4:1997 Optics and optical instruments -- Preparation of drawings for optical elements and systems -- Part 4: Material imperfections -- Inhomogeneity and striae | 90.92 | ISO/TC 172/SC 1 |
| ISO 10110-5:1996 Optics and optical instruments -- Preparation of drawings for optical elements and systems -- Part 5: Surface form tolerances | 95.99 | ISO/TC 172/SC 1 |
| ISO/DIS 10110-5 Optics and photonics -- Preparation of drawings for optical elements and systems -- Part 5: Surface form tolerances | 40.00 | ISO/TC 172/SC 1 |
| ISO 10110-5:2007 Optics and photonics -- Preparation of drawings for optical elements and systems -- Part 5: Surface form tolerances | 90.92 | ISO/TC 172/SC 1 |
| ISO 10110-5:1996/Cor 1:1996 | 95.99 | ISO/TC 172/SC 1 |
| ISO/DIS 10110-6 Optics and optical instruments -- Preparation of drawings for optical elements and systems -- Part 6: Centring tolerances | 40.00 | ISO/TC 172/SC 1 |
| ISO 10110-6:1996 Optics and optical instruments -- Preparation of drawings for optical elements and systems -- Part 6: Centring tolerances | 90.92 | ISO/TC 172/SC 1 |
| ISO 10110-6:1996/Cor 1:1999 | 60.60 | ISO/TC 172/SC 1 |
| ISO 10110-7:1996 Optics and optical instruments -- Preparation of drawings for optical elements and systems -- Part 7: Surface imperfection tolerances | 95.99 | ISO/TC 172/SC 1 |
| ISO 10110-7:2008 Optics and photonics -- Preparation of drawings for optical elements and systems -- Part 7: Surface imperfection tolerances | 90.92 | ISO/TC 172/SC 1 |
| ISO 10110-8:2010 Optics and photonics -- Preparation of drawings for optical elements and systems -- Part 8: Surface texture; roughness and waviness | 60.60 | ISO/TC 172/SC 1 |
| ISO 10110-8:1997 Optics and optical instruments -- Preparation of drawings for optical elements and systems -- Part 8: Surface texture | 95.99 | ISO/TC 172/SC 1 |
| ISO 10110-9:1996 Optics and optical instruments -- Preparation of drawings for optical elements and systems -- Part 9: Surface treatment and coating | 90.92 | ISO/TC 172/SC 1 |
| ISO 10110-10:2004 Optics and photonics -- Preparation of drawings for optical elements and systems -- Part 10: Table representing data of optical elements and cemented assemblies | 90.93 | ISO/TC 172/SC 1 |
| ISO 10110-10:1996 Optics and optical instruments -- Preparation of drawings for optical elements and systems -- Part 10: Table representing data of a lens element | 95.99 | ISO/TC 172/SC 1 |
| ISO 10110-11:1996 Optics and photonics -- Preparation of drawings for optical elements and systems -- Part 11: Non-toleranced data | 90.20 | ISO/TC 172/SC 1 |
| ISO 10110-11:1996/Cor 1:2006 | 60.60 | ISO/TC 172/SC 1 |
| ISO 10110-12:2007 Optics and photonics -- Preparation of drawings for optical elements and systems -- Part 12: Aspheric surfaces | 90.93 | ISO/TC 172/SC 1 |
| ISO 10110-12:1997 Optics and optical instruments -- Preparation of drawings for optical elements and systems -- Part 12: Aspheric surfaces | 95.99 | ISO/TC 172/SC 1 |
| ISO 10110-12:2007/FDAmd 1 | 50.20 | ISO/TC 172/SC 1 |
| ISO 10110-14:2007 Optics and photonics -- Preparation of drawings for optical elements and systems -- Part 14: Wavefront deformation tolerance | 90.93 | ISO/TC 172/SC 1 |
| ISO 10110-14:2003 Optics and optical instruments -- Preparation of drawings for optical elements and systems -- Part 14: Wavefront deformation tolerance | 95.99 | ISO/TC 172/SC 1 |
| ISO 10110-17:2004 Optics and photonics -- Preparation of drawings for optical elements and systems -- Part 17: Laser irradiation damage threshold | 90.93 | ISO/TC 172/SC 1 |
| ISO/DIS 10110-19 Optics and photonics -- Preparation of drawings for optical elements and systems -- Part 19: Optical freeform surfaces | 40.00 | ISO/TC 172/SC 1 |
| ISO 10934-1:2002 Optics and optical instruments -- Vocabulary for microscopy -- Part 1: Light microscopy | 90.93 | ISO/TC 172/SC 5 |
| ISO 10934-2:2007 Optics and optical instruments -- Vocabulary for microscopy -- Part 2: Advanced techniques in light microscopy | 90.93 | ISO/TC 172/SC 5 |
| ISO 10935:2009 Microscopes -- Interfacing connection type C | 60.60 | ISO/TC 172/SC 5 |
| ISO 10935:1996 Optics and optical instruments -- Microscopes -- Interfacing connection type C | 95.99 | ISO/TC 172/SC 5 |
| ISO 10936-1:2000 Optics and optical instruments -- Operation microscopes -- Part 1: Requirements and test methods | 90.93 | ISO/TC 172/SC 5 |
| ISO 10936-2:2001 Optics and optical instruments -- Operation microscopes -- Part 2: Light hazard from operation microscopes used in ocular surgery | 95.99 | ISO/TC 172/SC 7 |
| ISO 10936-2:2010 Optics and photonics -- Operation microscopes -- Part 2: Light hazard from operation microscopes used in ocular surgery | 60.60 | ISO/TC 172/SC 7 |
| ISO 10937:2000 Optics and optical instruments -- Microscopes -- Diameter of interchangeable eyepieces | 90.93 | ISO/TC 172/SC 5 |
| ISO 10937:1997 Optics and optical instruments -- Microscopes -- Diameter of interchangeable eyepieces for microscopes with tube length 160 mm | 95.99 | ISO/TC 172/SC 5 |
| ISO 11382:2010 Optics and photonics -- Optical materials and components -- Characterization of optical materials used in the infrared spectral range from 0,78 µm to 25 µm | 60.60 | ISO/TC 172/SC 3 |
| ISO 11882:1997 Optics and optical instruments -- Microscopes -- Interfacing connection for 35 mm SLR photo cameras (T-thread adaptation) | 90.93 | ISO/TC 172/SC 5 |
| ISO 11883:1997 Optics and optical instruments -- Microscopes -- Marking of stereomicroscopes | 90.93 | ISO/TC 172/SC 5 |
| ISO 11884-1:1998 Optics and optical instruments -- Minimum requirements for stereomicroscopes -- Part 1: Stereomicroscopes for general use | 95.99 | ISO/TC 172/SC 5 |
| ISO 11884-1:2006 Optics and photonics -- Minimum requirements for stereomicroscopes -- Part 1: Stereomicroscopes for general use | 90.93 | ISO/TC 172/SC 5 |
| ISO 11884-2:1997 Optics and optical instruments -- Minimum requirements for stereomicroscopes -- Part 2: High performance microscopes | 95.99 | ISO/TC 172/SC 5 |
| ISO 11884-2:2007 Optics and photonics -- Minimum requirements for stereomicroscopes -- Part 2: High performance microscopes | 90.93 | ISO/TC 172/SC 5 |
| ISO 12853:1997 Optics and optical instruments -- Microscopes -- Information provided to the user | 90.20 | ISO/TC 172/SC 5 |
| ISO 13695:2004 Optics and photonics -- Lasers and laser-related equipment -- Test methods for the spectral characteristics of lasers | 90.93 | ISO/TC 172/SC 9 |
| ISO 14132-1:2002 Optics and optical instruments -- Vocabulary for telescopic systems -- Part 1: General terms and alphabetical indexes of terms in ISO 14132 | 90.93 | ISO/TC 172/SC 4 |
| ISO 14132-2:2002 Optics and optical instruments -- Vocabulary for telescopic systems -- Part 2: Terms for binoculars, monoculars and spotting scopes | 90.92 | ISO/TC 172/SC 4 |
| ISO 14132-2:2002/Cor 1:2006 | 60.60 | ISO/TC 172/SC 4 |
| ISO/CD 14132-3 Optics and optical instruments -- Vocabulary for telescopic systems -- Part 3: Terms for telescopic sights | 30.60 | ISO/TC 172/SC 4 |
| ISO 14132-3:2002 Optics and optical instruments -- Vocabulary for telescopic systems -- Part 3: Terms for telescopic sights | 90.92 | ISO/TC 172/SC 4 |
| ISO 14132-4:2002 Optics and optical instruments -- Vocabulary for telescopic systems -- Part 4: Terms for astronomical telescopes | 90.93 | ISO/TC 172/SC 4 |
| ISO 14132-5:2008 Optics and photonics -- Vocabulary for telescopic systems -- Part 5: Terms for night vision devices | 90.60 | ISO/TC 172/SC 4 |
| ISO 14133-1:2006 Optics and optical instruments -- Specifications for binoculars, monoculars and spotting scopes -- Part 1: General purpose instruments | 90.60 | ISO/TC 172/SC 4 |
| ISO 14133-2:2006 Optics and optical instruments -- Specifications for binoculars, monoculars and spotting scopes -- Part 2: High performance instruments | 90.60 | ISO/TC 172/SC 4 |
| ISO 14134:2006 Optics and optical instruments -- Specifications for astronomical telescopes | 90.60 | ISO/TC 172/SC 4 |
| ISO/CD 14135-1 Optics and optical instruments -- Specifications for telescopic sights -- Part 1: General-purpose instruments | 30.60 | ISO/TC 172/SC 4 |
| ISO 14135-1:2003 Optics and optical instruments -- Specifications for telescopic sights -- Part 1: General-purpose instruments | 90.92 | ISO/TC 172/SC 4 |
| ISO 14135-2:2003 Optics and optical instruments -- Specifications for telescopic sights -- Part 2: High-performance instruments | 90.92 | ISO/TC 172/SC 4 |
| ISO/CD 14135-2 Optics and optical instruments -- Specifications for telescopic sights -- Part 2: High-performance instruments | 30.60 | ISO/TC 172/SC 4 |
| ISO 14490-1:2005 Optics and optical instruments -- Test methods for telescopic systems -- Part 1: Test methods for basic characteristics | 90.93 | ISO/TC 172/SC 4 |
| ISO 14490-2:2005 Optics and optical instruments -- Test methods for telescopic systems -- Part 2: Test methods for binocular systems | 90.93 | ISO/TC 172/SC 4 |
| ISO 14490-3:2004 Optics and optical instruments -- Test methods for telescopic systems -- Part 3: Test methods for telescopic sights | 90.92 | ISO/TC 172/SC 4 |
| ISO/WD 14490-3 Optics and optical instruments -- Test methods for telescopic systems -- Part 3: Test methods for telescopic sights | 20.20 | ISO/TC 172/SC 4 |
| ISO 14490-4:2005 Optics and optical instruments -- Test methods for telescopic systems -- Part 4: Test methods for astronomical telescopes | 90.93 | ISO/TC 172/SC 4 |
| ISO 14490-5:2005 Optics and optical instruments -- Test methods for telescopic systems -- Part 5: Test methods for transmittance | 90.92 | ISO/TC 172/SC 4 |
| ISO/WD 14490-5 Optics and optical instruments -- Test methods for telescopic systems -- Part 5: Test methods for transmittance | 20.20 | ISO/TC 172/SC 4 |
| ISO 14490-6:2005 Optics and optical instruments -- Test methods for telescopic systems -- Part 6: Test methods for veiling glare index | 90.93 | ISO/TC 172/SC 4 |
| ISO 14490-7:2005 Optics and optical instruments -- Test methods for telescopic systems -- Part 7: Test methods for limit of resolution | 90.93 | ISO/TC 172/SC 4 |
| ISO 14490-8:2011 Optics and optical instruments -- Test methods for telescopic systems -- Part 8: Test methods for night-vision devices | 60.60 | ISO/TC 172/SC 4 |
| ISO 14997:2011 Optics and photonics -- Test methods for surface imperfections of optical elements | 90.92 | ISO/TC 172/SC 1 |
| ISO 14997:2003 Optics and optical instruments -- Test methods for surface imperfections of optical elements | 95.99 | ISO/TC 172/SC 1 |
| ISO/TR 14999-1:2005 Optics and photonics -- Interferometric measurement of optical elements and optical systems -- Part 1: Terms, definitions and fundamental relationships | 60.60 | ISO/TC 172/SC 1 |
| ISO/TR 14999-2:2005 Optics and photonics -- Interferometric measurement of optical elements and optical systems -- Part 2: Measurement and evaluation techniques | 60.60 | ISO/TC 172/SC 1 |
| ISO/TR 14999-3:2005 Optics and photonics -- Interferometric measurement of optical elements and optical systems -- Part 3: Calibration and validation of interferometric test equipment and measurements | 60.60 | ISO/TC 172/SC 1 |
| ISO 14999-4:2007 Optics and photonics -- Interferometric measurement of optical elements and optical systems -- Part 4: Interpretation and evaluation of tolerances specified in ISO 10110 | 90.92 | ISO/TC 172/SC 1 |
| ISO/DIS 14999-4 Optics and photonics -- Interferometric measurement of optical elements and optical systems -- Part 4: Interpretation and evaluation of tolerances specified in ISO 10110 | 40.00 | ISO/TC 172/SC 1 |
| ISO 15227:2000 Optics and optical instruments -- Microscopes -- Testing of stereomicroscopes | 90.93 | ISO/TC 172/SC 5 |
| ISO 15362:1998 Optics and optical instruments -- Stereomicroscopes -- Information provided to the user | 90.20 | ISO/TC 172/SC 5 |
| ISO 15632:2002 Microbeam analysis -- Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors | 95.99 | ISO/TC 202 |
| ISO 15795:2002 Optics and optical instruments -- Quality evaluation of optical systems -- Assessing the image quality degradation due to chromatic aberrations | 90.93 | ISO/TC 172/SC 1 |
| ISO 15795:2002/Cor 1:2007 | 60.60 | ISO/TC 172/SC 1 |
| ISO/DIS 15932 Microbeam analysis -- Analytical electron microscopy -- Vocabulary | 40.99 | ISO/TC 202/SC 1 |
| ISO 16700:2004 Microbeam analysis -- Scanning electron microscopy -- Guidelines for calibrating image magnification | 90.60 | ISO/TC 202/SC 4 |
| ISO/TR 16743:2013 Optics and photonics -- Wavefront sensors for characterising optical systems and optical components | 60.60 | ISO/TC 172/SC 1 |
| ISO/DIS 17328 Optics and photonics -- Optical materials and components -- Test method for refractive index of infrared optical materials | 40.20 | ISO/TC 172/SC 3 |
| ISO/DIS 17411 Optics and photonics -- Optical materials and components -- Test method for homogeneity of optical glasses by laser interferometry | 40.20 | ISO/TC 172/SC 3 |
| ISO/NP 18221 Microscopes -- Microscopes with digital imaging displays -- Information provided to the user regarding imaging performance | 10.99 | ISO/TC 172/SC 5 |
| ISO 19012-1:2007 Optics and photonics -- Designation of microscope objectives -- Part 1: Flatness of field/Plan | 95.99 | ISO/TC 172/SC 5 |
| ISO 19012-1:2011 Microscopes -- Designation of microscope objectives -- Part 1: Flatness of field/Plan | 95.99 | ISO/TC 172/SC 5 |
| ISO 19012-1:2013 Microscopes -- Designation of microscope objectives -- Part 1: Flatness of field/Plan | 60.60 | ISO/TC 172/SC 5 |
| ISO 19012-2:2013 Microscopes -- Designation of microscope objectives -- Part 2: Chromatic correction | 60.60 | ISO/TC 172/SC 5 |
| ISO 19012-2:2009 Optics and photonics -- Designation of microscope objectives -- Part 2: Chromatic correction | 95.99 | ISO/TC 172/SC 5 |
| ISO/CD 19012-3 Microscopes -- Designation of microscope objectives -- Part 3: Spectral transmittance | 30.60 | ISO/TC 172/SC 5 |
| ISO 20473:2007 Optics and photonics -- Spectral bands | 90.60 | ISO/TC 172 |
| ISO 21094:2008 Optics and photonics -- Telescopic systems -- Specifications for night vision devices | 90.60 | ISO/TC 172/SC 4 |
| ISO 22493:2008 Microbeam analysis -- Scanning electron microscopy -- Vocabulary | 90.60 | ISO/TC 202/SC 1 |
| ISO 23584-1:2009 Optics and photonics -- Specification of reference dictionary -- Part 1: General overview on organization and structure | 60.60 | ISO/TC 172 |
| ISO 23584-2:2012 Optics and photonics -- Specification of reference dictionary -- Part 2: Classes' and properties' definitions | 60.60 | ISO/TC 172 |
| ISO/TS 24597:2011 Microbeam analysis -- Scanning electron microscopy -- Methods of evaluating image sharpness | 60.60 | ISO/TC 202/SC 4 |
| ISO 25297-1:2012 Optics and photonics -- Electronic exchange of optical data -- Part 1: NODIF information model | 60.60 | ISO/TC 172/SC 1 |
| ISO 25297-1:2010 Optics and photonics -- Electronic exchange of optical data -- Part 1: NODIF information model | 95.99 | ISO/TC 172/SC 1 |
| ISO 25297-2:2011 Optics and photonics -- Electronic exchange of optical data -- Part 2: Mapping to the classes and properties defined in ISO 23584 | 60.60 | ISO/TC 172/SC 1 |
| ISO 29301:2010 Microbeam analysis -- Analytical transmission electron microscopy -- Methods for calibrating image magnification by using reference materials having periodic structures | 60.60 | ISO/TC 202/SC 3 |
