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Secretariat:
SAC
Secretary: Mr. Jiang Zhao
Chairperson: Mr. Jian Xu until end 2014
ISO Central Secretariat contact: M. Stéphane Sauvage
Creation date: 1991
Scope:
Standardization in the field of microbeam analysis (measurement, parameters, methods and reference materials) which uses electrons as an incident beam and electrons and photons as the detection signal.
Note:
The purpose is to analyze the compositional and structural characteristics of solid materials. The volume of analysis will generally involve a depth up to 10 micrometers and a surface area less than 100 square micrometers.
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ISO/TC 202 - Secretariat
China (SAC)
Address
Institute of Chemistry
Bei Yi Jie 2#, ZhongGuanCun
CN-Beijing 100190
Tel: +86 10 82 61 84 76
Fax: +86 10 82 61 84 76
Secretariat direct:
Tel: +86 10 8261 9847
E-mail: jzhao@iccas.ac.cn
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Subcommittees/Working Groups:
Subcommittee/Working Group Title ISO/TC 202/SC 1 Terminology ISO/TC 202/SC 2 Electron probe microanalysis ISO/TC 202/SC 3 Analytical electron microscopy ISO/TC 202/SC 4 Scanning electron microscopy (SEM) -
Liaison Committee to ISO/TC 202
The below committees may see the documents of ISO/TC 202 :
ISO committees in liaison:
Liaison Committee from ISO/TC 202
ISO/TC 202 can access the documents of the below committees :
ISO committees in liaison:
Organizations in liaison:
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Meeting calendar
* Information definite but meeting not yet formally convened
** ProvisionalMonth Date Location TC/SC October 2013 Boulder (USA) ** TC 202 & SCs -
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